Effect of de-trapping on carrier transport process in semi-insulating CdZnTe*
Guo Rong-Rong, Jie Wan-Qi†, Zha Gang-Qiang, Xu Ya-Dong, Feng Tao, Wang Tao, Du Zhuo-Tong
       
The LBIC measurements exposing from cathode side with OD2 (a) laser-induced transient current waveforms measured at different bias voltages, (b) the dependence of the electron drift velocity on electric field strength.