Effect of de-trapping on carrier transport process in semi-insulating CdZnTe*
Guo Rong-Rong, Jie Wan-Qi†, Zha Gang-Qiang, Xu Ya-Dong, Feng Tao, Wang Tao, Du Zhuo-Tong
       
Typical Pockels images (polarizers crossed) of (a) unbiased sample and (b) sample biased at 300 V at room temperature; (c) average internal electric field profile along sample thickness.