Characterization of CoPt nanowire fabricated by glancing angle deposition
Satoshi Kitaia),b)†, Zhang Zheng-Juna), Shi Jib), Yoshio Nakamurab)
       
XRD profiles of the samples. (a) Series 1, (b) Series 2, (c) annealed samples of Series 2, (d) a conventional film, and (e) the pure Co nanowire.