Characterization of CoPt nanowire fabricated by glancing angle deposition
Satoshi Kitaia), b)† 
, Zhang Zheng-Juna) , Shi Jib) , Yoshio Nakamurab)
, Zhang Zheng-Jun
Characterization of CoPt nanowire fabricated by glancing angle deposition |
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Satoshi Kitai
, Zhang Zheng-Jun |
| SEM images of #5 after annealing. (a) 300 °C, (b) 400 °C, (c) 500 °C, and (d) 600 °C. |
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