Application of an Al-doped zinc oxide subcontact layer on vanadium-compensated 6H–SiC photoconductive switches<xref ref-type="fn" rid="cpb142042fn1">*</xref>

Application of an Al-doped zinc oxide subcontact layer on vanadium-compensated 6H–SiC photoconductive switches*

Zhou Tian-Yu^a),^b), Liu Xue-Chao^a)†, Huang Wei^a), Dai Chong-Chong^a),^b), Zheng Yan-Qing^a), Shi Er-Wei^a)

Test circuit for measuring SiC PCSSs.