Exciplex formation and electroluminescent absorption in ultraviolet organic light-emitting diodes*
Zhang Qia), Zhang Haoa), Zhang Xiao-Wenb)†, Xu Taoa), Wei Bina)‡
       
(a) Normalized PL spectra of CBP and TAZ (solid-state film), and (b) normalized EL spectra of device C, E, F, and G. The inset shows the ratio of EL intensity of TAZ ( λ = 376 nm) to that of CBP ( λ = 406 nm) as a function of TAZ thickness.