Fin width and height dependence of bipolar amplification in bulk FinFETs submitted to heavy ion irradiation*
Yu Jun-Tinga), Chen Shu-Minga),b), Chen Jian-Juna), Huang Peng-Chenga)
       
(a) The amount of charge collection in FinFET and diode devices with different fin heights. (b) The corresponding bipolar amplification for different fin-height FinFETs. (c) The SET voltage at FWHM for different fin-height FinFETs. All simulations are conducted with the same ion LET at 10 MeV·cm2/mg.