In situ electrical transport measurementof superconductive ultrathin films*
Liu Can-Huaa),b), Jia Jin-Fenga),b)
       
Results of in situ 4PP transport measurement on single-layer FeSe/STO.[ 8 ] (a) A series of I – V curves taken at a fixed tip location and different temperatures. (b) Temperature dependence of zero-bias resistance extracted from the I – V curves, showing a sharp transition at around 99 K. (c) Schematic illustration explaining the sharpness of the transition found in panel (b).