Analysis of the interdigitated back contact solar cells: The n-type substrate lifetime and wafer thickness
Zhang Weia), Chen Chena), Jia Rui†a), Sun Yuna), Xing Zhaoa), Jin Zhia), Liu Xin-Yua), Liu Xiao-Wenb)
       
Variations of open-circuit voltage with wafer thickness for various bulk lifetimes, calculated by (a) the TCAD model of IBC solar cells, and (b) simple model of hole generation and diffusion. (c) Process of generation and diffusion of holes.