The interface density dependence of the electrical properties of 0.9Pb(Sc0.5Ta0.5)O3–0.1PbTiO3/0.55Pb(Sc0.5Ta0.5)O3–0.45PbTiO3 multilayer thin films
Li Xue-Donga),b), Liu Hongb), Wu Jia-Gangb), Liu Ganga), Xiao Ding-Quanb), Zhu Jian-Guo†b)
       
(a) Remnant polarization and coercive field, and (b) leakage current density of the (PSTT10/45) n multilayer thin film as a function of interface density. Inset shows the typical leakage current of the film with n = 4.