Mechanism of defect evolution in H + and He + implanted InP
Ren-Jie Liu(刘仁杰), Jia-Jie Lin(林家杰), N Daghbouj, Jia-Liang Sun(孙嘉良), Tian-Gui You(游天桂), Peng Gao(高鹏), Nie-Feng Sun(孙聂枫), and Min Liao(廖敏)
Chin. Phys. B . 2021, (8): 86104 -086104 .  DOI: 10.1088/1674-1056/abf640