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CN 11-5639/O4
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Other articles related with "61.80.Ed":
76106 Jia-Nan Wei, Chao-Hui He, Pei Li, Yong-Hong Li, Hong-Xia Guo
  Impact of proton-induced alteration of carrier lifetime on single-event transient in SiGe heterojunction bipolar transistor
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98501 Jin-Shun Bi, Kai Xi, Bo Li, Hai-Bin Wang, Lan-Long Ji, Jin Li, Ming Liu
  Heavy ion induced upset errors in 90-nm 64 Mb NOR-type floating-gate Flash memory
    Chin. Phys. B   2018 Vol.27 (9): 98501-098501 [Abstract] (166) [HTML 1 KB] [PDF 774 KB] (105)
86103 Ya-Nan Yin, Jie Liu, Qing-Gang Ji, Pei-Xiong Zhao, Tian-Qi Liu, Bing Ye, Jie Luo, You-Mei Sun, Ming-Dong Hou
  Influences of total ionizing dose on single event effect sensitivity in floating gate cells
    Chin. Phys. B   2018 Vol.27 (8): 86103-086103 [Abstract] (93) [HTML 1 KB] [PDF 1134 KB] (150)
48503 Li-Hua Dai, Da-Wei Bi, Zhi-Yuan Hu, Xiao-Nian Liu, Meng-Ying Zhang, Zheng-Xuan Zhang, Shi-Chang Zou
  Research on the radiation hardened SOI devices with single-step Si ion implantation
    Chin. Phys. B   2018 Vol.27 (4): 48503-048503 [Abstract] (262) [HTML 1 KB] [PDF 1624 KB] (214)
36102 Xiao-Long Li, Wu Lu, Xin Wang, Xin Yu, Qi Guo, Jing Sun, Mo-Han Liu, Shuai Yao, Xin-Yu Wei, Cheng-Fa He
  Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor
    Chin. Phys. B   2018 Vol.27 (3): 36102-036102 [Abstract] (200) [HTML 0 KB] [PDF 1128 KB] (194)
16103 J Assaf
  Bulk and surface damages in complementary bipolar junction transistors produced by high dose irradiation
    Chin. Phys. B   2018 Vol.27 (1): 16103-016103 [Abstract] (157) [HTML 1 KB] [PDF 1198 KB] (196)
96102 Jia-Nan Wei, Hong-Xia Guo, Feng-Qi Zhang, Yin-Hong Luo, Li-Li Ding, Xiao-Yu Pan, Yang Zhang, Yu-Hui Liu
  Ionizing radiation effect on single event upset sensitivity of ferroelectric random access memory
    Chin. Phys. B   2017 Vol.26 (9): 96102-096102 [Abstract] (166) [HTML 0 KB] [PDF 551 KB] (232)
96103 Qiwen Zheng, Jiangwei Cui, Mengxin Liu, Dandan Su, Hang Zhou, Teng Ma, Xuefeng Yu, Wu Lu, Qi Guo, Fazhan Zhao
  Direct measurement and analysis of total ionizing dose effect on 130 nm PD SOI SRAM cell static noise margin
    Chin. Phys. B   2017 Vol.26 (9): 96103-096103 [Abstract] (191) [HTML 0 KB] [PDF 432 KB] (273)
98505 Wei-Wei Yan, Lin-Chun Gao, Xiao-Jing Li, Fa-Zhan Zhao, Chuan-Bin Zeng, Jia-Jun Luo, Zheng-Sheng Han
  Experimental and simulation studies of single-event transient in partially depleted SOI MOSFET
    Chin. Phys. B   2017 Vol.26 (9): 98505-098505 [Abstract] (202) [HTML 0 KB] [PDF 2992 KB] (215)
87501 Yan Cui, Ling Yang, Teng Gao, Bo Li, Jia-Jun Luo
  Total ionizing radiation-induced read bit-errors in toggle magnetoresistive random-access memory devices
    Chin. Phys. B   2017 Vol.26 (8): 87501-087501 [Abstract] (155) [HTML 1 KB] [PDF 1555 KB] (190)
74217 Xu-Yao Zhao, Dun-Lu Sun, Jian-Qiao Luo, Hui-Li Zhang, Zhong-Qing Fang, Cong Quan, Xiu-Li Li, Mao-Jie Cheng, Qing-Li Zhang, Shao-Tang Yin
  Spectroscopic and radiation-resistant properties of Er, Pr: GYSGG laser crystal operated at 2.79μm
    Chin. Phys. B   2017 Vol.26 (7): 74217-074217 [Abstract] (166) [HTML 1 KB] [PDF 519 KB] (186)
46104 Qi-Feng Zhao, Yi-Qi Zhuang, Jun-Lin Bao, Wei Hu
  Radiation-induced 1/f noise degradation of PNP bipolar junction transistors at different dose rates
    Chin. Phys. B   2016 Vol.25 (4): 46104-046104 [Abstract] (211) [HTML 1 KB] [PDF 363 KB] (350)
106106 Zheng Qi-Wen, Cui Jiang-Wei, Zhou Hang, Yu De-Zhao, Yu Xue-Feng, Lu Wu, Guo Qi, Ren Di-Yuan
  Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation
    Chin. Phys. B   2015 Vol.24 (10): 106106-106106 [Abstract] (207) [HTML 1 KB] [PDF 314 KB] (370)
88503 Liu Yuan, Chen Hai-Bo, Liu Yu-Rong, Wang Xin, En Yun-Fei, Li Bin, Lu Yu-Dong
  Low frequency noise and radiation response in the partially depleted SOI MOSFETs with ion implanted buried oxide
    Chin. Phys. B   2015 Vol.24 (8): 88503-088503 [Abstract] (211) [HTML 1 KB] [PDF 508 KB] (293)
106102 Zheng Qi-Wen, Yu Xue-Feng, Cui Jiang-Wei, Guo Qi, Ren Di-Yuan, Cong Zhong-Chao, Zhou Hang
  Pattern imprinting in deep sub-micron static random access memories induced by total dose irradiation
    Chin. Phys. B   2014 Vol.23 (10): 106102-106102 [Abstract] (134) [HTML 1 KB] [PDF 473 KB] (384)
88505 Bi Jin-Shun, Zeng Chuan-Bin, Gao Lin-Chun, Liu Gang, Luo Jia-Jun, Han Zheng-Sheng
  Estimation of pulsed laser-induced single event transient in a partially depleted silicon-on-insulator 0.18-μm MOSFET
    Chin. Phys. B   2014 Vol.23 (8): 88505-088505 [Abstract] (245) [HTML 1 KB] [PDF 942 KB] (401)
98501 Li Xing-Ji, Liu Chao-Ming, Sun Zhong-Liang, Xiao Li-Yi, He Shi-Yu
  Effect of ionizing radiation on dual 8-bit analog-to-digital converters (AD9058) with various dose rates and bias conditions
    Chin. Phys. B   2013 Vol.22 (9): 98501-098501 [Abstract] (219) [HTML 1 KB] [PDF 346 KB] (481)
36103 Gao Bo, Liu Gang, Wang Li-Xin, Han Zheng-Sheng, Song Li-Mei, Zhang Yan-Fei, Teng Rui, Wu Hai-Zhou
  Radiation damage effects on power VDMOS devices with composite SiO2–Si3N4 films
    Chin. Phys. B   2013 Vol.22 (3): 36103-036103 [Abstract] (317) [HTML 0 KB] [PDF 523 KB] (569)
66104 Jin Xiao-Ming, Fan Ru-Yu, Chen Wei, Lin Dong-Sheng, YangShan-Chao, Bai Xiao-Yan, Liu Yan, GuoXiao-Qiang, Wang Gui-Zhen
  Synergistic effects of neutron and gamma ray irradiation of commercial CHMOS microcontroller
    Chin. Phys. B   2010 Vol.19 (6): 66104-066104 [Abstract] (1229) [HTML 0 KB] [PDF 2464 KB] (970)
573 Zhang Chun-Xi, Tian Hai-Ting, Li Min, Jin Jing, Song Ning-Fang
  Space radiation effect on fibre optical gyroscope control circuit and compensation algorithm
    Chin. Phys. B   2008 Vol.17 (2): 573-577 [Abstract] (991) [HTML 0 KB] [PDF 145 KB] (500)
3760 Li Dong-Mei, Wang Zhi-Hua, Huangfu Li-Ying, Gou Qiu-Jing
  Study of total ionizing dose radiation effects on enclosed gate transistors in a commercial CMOS technology
    Chin. Phys. B   2007 Vol.16 (12): 3760-3765 [Abstract] (984) [HTML 0 KB] [PDF 991 KB] (1573)
662 Zhang Li, Bian Xia, Mei Dong-cheng
  GAMMA-RAY LIGHT CURVE AND PHASE-RESOLVED SPECTRA FROM GEMINGA PULSAR
    Chin. Phys. B   2001 Vol.10 (7): 662-665 [Abstract] (668) [HTML 0 KB] [PDF 138 KB] (427)
439 LIU CHANG-SHI, MA ZHONG-QUAN, ZHAO YUAN-FU
  RADIATION-INDUCED DEFECTS IN RADIATION HARD AND SOFT OXIDES
    Chin. Phys. B   1994 Vol.3 (6): 439-444 [Abstract] (536) [HTML 0 KB] [PDF 166 KB] (289)
176 ZHANG DAO-FAN, ZHU YONG, YANG HUA-GUANG, MA WEN-YI, GU BEN-YUAN
  INFLUENCE OF γ-RADIATION ON THE DIELECTRIC CHARACTERISTICS IN Rb2ZnCl4 SINGLE CRYSTALS AT INCOMMENSURATE-COMMENSURATE PHASE TRANSITION
    Chin. Phys. B   1994 Vol.3 (3): 176-181 [Abstract] (570) [HTML 0 KB] [PDF 162 KB] (319)
270 ZHANG XING-YUAN, ZHOU YI-QIN
  STUDIES ON THE RELATIONSHIPS BETWEEN THE STRUCTURE AND THE LOCALIZED ENERGY STATES OF POLY (ETHYLENE TEREPHTHALATE) ELECTRETS
    Chin. Phys. B   1993 Vol.2 (4): 270-279 [Abstract] (648) [HTML 0 KB] [PDF 302 KB] (356)
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