TY - Chin. Phys. B A1 - Qing Zhu(朱青), Xiao-Hua Ma(马晓华), Yi-Lin Chen(陈怡霖), Bin Hou(侯斌), Jie-Jie Zhu(祝杰杰), Meng Zhang(张濛), Mei Wu(武玫), Ling Yang(杨凌), Yue Hao(郝跃) T1 - Negative bias-induced threshold voltage instability and zener/interface trapping mechanism in GaN-based MIS-HEMTs Y1 - 2020-04-05 JF - Chinese Physics B JO - Chin. Phys. B SP - 47304 EP - 047304 VL - 29 IS - 4 UR - https://cpb.iphy.ac.cn N1 - 10.1088/1674-1056/ab7809 ER -