Chin. Phys. B
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Chin. Phys. B  2018, Vol. 27 Issue (7): 076101    DOI: 10.1088/1674-1056/27/7/076101
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Investigation of flux dependent sensitivity on single event effect in memory devices
Jie Luo(罗捷)1,2,3, Tie-shan Wang(王铁山)2, Dong-qing Li(李东青)1, Tian-qi Liu(刘天奇)1, Ming-dong Hou(侯明东)1, You-mei Sun(孙友梅)1, Jing-lai Duan(段敬来)1, Hui-jun Yao(姚会军)1, Kai Xi(习凯)1, Bing Ye(叶兵)1, Jie Liu(刘杰)1
1 Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;
2 School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China;
3 University of Chinese Academy of Sciences, Beijing 100049, China

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