Chin. Phys. B
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Chin. Phys. B  2018, Vol. 27 Issue (7): 078501    DOI: 10.1088/1674-1056/27/7/078501
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY Current Issue| Next Issue| Archive| Adv Search |
Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM
Yin-Yong Luo(罗尹虹), Feng-Qi Zhang(张凤祁), Xiao-Yu Pan(潘霄宇), Hong-Xia Guo(郭红霞), Yuan-Ming Wang(王圆明)
State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi'an 710024, China

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