Chin. Phys. B
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Chin. Phys. B  2018, Vol. 27 Issue (4): 047901    DOI: 10.1088/1674-1056/27/4/047901
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Off-stoichiometry indexation of BiFeO3 thin film on silicon by Rutherford backscattering spectrometry
Ze-Song Wang(王泽松)1, Ren-Zheng Xiao(肖仁政)2, Chang-Wei Zou(邹长伟)1, Wei Xie(谢伟)1, Can-Xin Tian(田灿鑫)1, Shu-Wen Xue(薛书文)1, Gui-Ang Liu(刘贵昂)1, Neena Devi3, De-Jun Fu(付德君)3
1. School of Physics and Technology, Lingnan Normal University, Zhanjiang 524048, China;
2. College of Mechanical and Power Engineering, Three Gorges University, Yichang 443002, China;
3. Key Laboratory of Artificial Micro-and Nano-Materials of Ministry of Education of China, School of Physics and Technology, Wuhan University, Wuhan 430072, China

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