Chin. Phys. B
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Chin. Phys. B  2018, Vol. 27 Issue (4): 047103    DOI: 10.1088/1674-1056/27/4/047103
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Passivation of carbon dimer defects in amorphous SiO2/4H-SiC (0001) interface: A first-principles study
Yi-Jie Zhang(张轶杰)1, Zhi-Peng Yin(尹志鹏)1, Yan Su(苏艳)2, De-Jun Wang(王德君)1
1. Liaoning Integrated Circuit Technology Key Laboratory, School of Control Science and Engineering, Faculty of Electronic Information and Electrical Engineering, Dalian University of Technology, Dalian 116024, China;
2. School of Physics, Dalian University of Technology, Dalian 116024, China

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