A synthetic semi-empirical physical model of secondary electron yield of metals under E-beam irradiation

doi:10.1088/1674-1056/26/9/097901

Abstract Calculations of secondary electron yield (SEY) by physical formula can hardly accord with experimental results precisely. Simplified descriptions of internal electron movements in the calculation and complex surface contamination states of real sample result in notable difference between simulations and experiments. In this paper, in order to calculate SEY of metal under complicated surface state accurately, we propose a synthetic semi-empirical physical model. The processes of excitation of internal secondary electron (SE) and movement toward surface can be simulated using this model. This model also takes into account the influences of incident angle and backscattering electrons as well as the surface gas contamination. In order to describe internal electronic states accurately, the penetration coefficient of incident electron is described as a function of material atom number. Directions of internal electrons are set to be uniform in each angle. The distribution of internal SEs is proposed by considering both the integration convergence and the cascade scattering process. In addition, according to the experiment data, relationship among desorption gas quantities, sample ultimate temperature and SEY is established. Comparing with experiment results, this synthetic semi-empirical physical model can describe the SEY of metal better than former formulas, especially in the aspect of surface contaminated states. The proposed synthetic semi-empirical physical model and presented results in this paper can be helpful for further studying SE emission, and offer an available method for estimating and taking advantage of SE emission accurately.

Keywords: secondary electron yield synthetic semi-empirical physical model metal electron irradiation

Received: 07 April 2017
Revised: 24 May 2017
Accepted manuscript online:

PACS:	79.20.Ap	(Theory of impact phenomena; numerical simulation)
	72.20.Dp	(General theory, scattering mechanisms)
	02.70.Uu	(Applications of Monte Carlo methods)
	72.80.Le	(Polymers; organic compounds (including organic semiconductors))

Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. U1537211 and 11675278) and the China Postdoctoral Science Foundation (Grant No. 2016M602944XB).

Corresponding Authors: Wan-Zhao Cui
E-mail: cuiwanzhao@163.com

Cite this article:

Guo-Bao Feng(封国宝), Wan-Zhao Cui(崔万照), Na Zhang(张娜), Meng Cao(曹猛), Chun-Liang Liu(刘纯亮) A synthetic semi-empirical physical model of secondary electron yield of metals under E-beam irradiation 2017 Chin. Phys. B 26 097901

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A synthetic semi-empirical physical model of secondary electron yield of metals under E-beam irradiation

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