Please wait a minute...
Chin. Phys. B, 2017, Vol. 26(9): 090601    DOI: 10.1088/1674-1056/26/9/090601
GENERAL Prev   Next  

ADC border effect and suppression of quantization error in the digital dynamic measurement

Li-Na Bai(白丽娜)1, Hai-Dong Liu(刘海东)1, Wei Zhou(周渭)1, Yong Zhang(张勇)2, Hong-Qi Zhai(翟鸿启)1, Zhen-Jian Cui(崔震健)1, Ming-Ying Zhao(赵明英)1, Xiao-Qian Gu(谷小倩)1, Bei-Ling Liu(刘蓓玲)1, Li-Bei Huang(黄李贝)1
1 Department of Measurement and Instrumentation, Xidian University, Xi'an 710071, China;
2 State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an 710049, China
Abstract  The digital measurement and processing is an important direction in the measurement and control field. The quantization error widely existing in the digital processing is always the decisive factor that restricts the development and applications of the digital technology. In this paper, we find that the stability of the digital quantization system is obviously better than the quantization resolution. The application of a border effect in the digital quantization can greatly improve the accuracy of digital processing. Its effective precision has nothing to do with the number of quantization bits, which is only related to the stability of the quantization system. The high precision measurement results obtained in the low level quantization system with high sampling rate have an important application value for the progress in the digital measurement and processing field.
Keywords:  quantization error      border effect      digital converter (ADC)  
Received:  20 May 2017      Revised:  18 July 2017      Accepted manuscript online: 
PACS:  06.20.Dk (Measurement and error theory)  
  07.50.Qx (Signal processing electronics)  
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 10978017 and 61201288), Shaanxi Natural Science Foundation Research Plan Projects, China (Grant No. 2014JM2-6128), and Shaanxi Major Technological Achievements Transformation and Guidance Special Projects, China (Grant No. 2015KTCG01-01).
Corresponding Authors:  Li-Na Bai     E-mail:  lnbai@mail.xidian.edu.cn

Cite this article: 

Li-Na Bai(白丽娜), Hai-Dong Liu(刘海东), Wei Zhou(周渭), Yong Zhang(张勇), Hong-Qi Zhai(翟鸿启), Zhen-Jian Cui(崔震健), Ming-Ying Zhao(赵明英), Xiao-Qian Gu(谷小倩), Bei-Ling Liu(刘蓓玲), Li-Bei Huang(黄李贝) ADC border effect and suppression of quantization error in the digital dynamic measurement 2017 Chin. Phys. B 26 090601

[1] Diddams S A, Bergquist J C, Jefferts S R and Oates C W 2004 Science. 306 1318
[2] Barber Z W, Babbitt W R, Kaylor B, Reibel R R and Roos P A 2010 Appl. Opt. 49 213
[3] Eramo R, Cavalieri S, Corsi C, Liontos I and Bellini M 2011 Phys. Rev. Lett. 106 213003
[4] Sturm S, Kohler F, Zatorski J, Wagner A and Harman Z 2014 Nature 506 467
[5] Resch K J, Pregnell K L, Prevedel R, Gilchrist A, Pryde G J, O'Brien J L and White A G 2007 Phys. Rev. Lett. 98 223601
[6] David J, Starling P, Ben D, Andrew N J and John C H 2010 Phys. Rev. A 82 063822
[7] Budovsky I and Hammond G 2005 IEEE Trans. Instrum. Meas. 54 483
[8] Wang B, Gao C, Chen W L, Miao J and Zhu X 2012 Sci. Rep. 2 556
[9] Archanaa M, Balamurugan K and Jayakumar M 2014 International Conference on Embedded Systems (ICES), July 3-5, 2014, Coimbatore, India, p. 39
[10] Li Z Q, Zhou W, Zhou H, Zhang X P and Zhao J 2013 Rev. Sci. Inst. 84 025106
[11] Giorgetta F R, Coddington I B E, Swann W C and Newbury N R 2010 Nat. Photon. 4 853
[12] Zhou W, Li Z Q and Bai L N 2014 Chin. Phys. Lett. 31 100602
[13] Bai L N, Su X, Zhou W and Ou X J 2015 Rev. Sci. Inst. 86 015106
[14] Rapp P E, Cellucci C J, Korslund K E, Watanabe T A A and Jiménez-Montaño M A 2001 Phys. Rev. E 64 016209
[15] Shan H T, Chen X K, Kong X J, Zhang Y, Liu Z, Li H B and Li T F 2009 IEEE 6th International Power Electronics and Motion Control Conference, May 17-20, 2009, Wuhan, China, p. 1554
[16] Pumplin J, Stump D R and Tung W K 2001 Phys. Rev. D 65 014011
[17] Kurten-Ihlenfeld W G and Landim R P 2014 29th Conference on Precision Electromagnetic Measurements (CPEM ), August 24-29, 2014, Rio de Janeiro, Brazil, p. 766
[18] Lin H B, and Lv X L 2010 International Conference on Electrical and Control Engineering, June 25-27, 2010, Wuhan, China, p. 2315
[19] An G C, and Sha Z Y 2007 8th International Conference on Electronic Measurement and Instruments, August 16-18, 2007, Xi'an, China, p. 1-453
[20] Roulleau P,Portier F,Roche P, Cavanna A,Faini G, Gennser U and Mailly D 2008 Phys. Rev. Lett. 100 126802
[21] Udem T, Holzwarth R and Hansch T W 2002 Nature 416 233
[22] Vanier J 2002 Phys. Today. 93 522
[23] Schröder G F, Levitt M and Brunger A T 2010 Nature 464 1218
[24] Jaseja T S, Javan A and Townes C H 1963 Phys. Rev. Lett. 10 165
[25] Zheng H X, Dougal R A and Ali M H 2013 Electric Ship Technologies Symposium (ESTS), April 22-24, 2013, Arlington, VA, USA, p. 292
[26] Antonio D, Zanette D H and Lŗpez D 2012 Nat. Commun. 3 806
[27] Ning B, Zhang S Y, Hou D, Wu J T and Li Z B 2014 Sci. Rep. 4 5109
[28] Affolderbach C and Mileti G A 2005 Rev. Sci. Inst. 76 073108
[29] Ali M H, Murata T And Tamura J A 2005 International Conference on Power Electronics and Drives Systems, November 28-December 1, 2005, Kuala Lumpur, Malaysia, p. 1566
[30] Lee H, Suh M G,Chen T, Li J and Diddams S A 2013 Nat. Commun. 4 2468
[31] Le N P T, Low K T and Yao L 2009 IEEE 8th International Conference on ASIC, October 20-23, 2009, IChangsha, Hunan, China, p. 363
[32] Michaelsen J and Wisland D A 2010 17th IEEE International Conference on Electronics, Circuits and Systems, December 12-15, 2010, Athens, Greece, p. 1132
[33] Shuai D X and Zhang X P 2010 International Conference on Electrical Machines and Systems, October 10-13, 2010, Incheon, South Korea, p. 329
[34] Frank S and Dominik J 2005 Phys. Rev. A 72 042324
[35] Chumak A V, Tiberkevich V S, Karenowska A D, Serga A A and Gregg J F 2010 Nat. Commun. 1 749
[36] Okuni H, Ito R, Yoshida H and Itakura T A 2007 IEEE 18th International Symposium on Personal, Indoor and Mobile Radio Communications, September 3-7, 2007, Athens, Greece, p. 1
[37] Kenji N, Amy K and Jordan C 2004 Phys. Rev. Lett. 93 250602
[38] Traverso P A, Florian C, Borgarino M and Filicori F 2006 IEEE Trans. Microw. Theory Tech. 54 4341
[39] Dai C X, Yin Z D, Hong Q and Kong S H 2010 5th IEEE Conference on Industrial Electronics and Applications, June 15-17, 2010, Taichung, Taiwan, p. 989
[40] Ye Y X, Xuan Z Q, Gu J S and Xuan Y 2014 Chin. Phys. B 23 120601
[41] Neumann A, Anders W, Kugeler O and Knobloch J 2010 Mod. Phys. 13 3280
[42] Lei S H,Han Y H and Li X W 2007 16th Asian Test Symposium (ATS), October 8-11 2007, Beijing, China, p. 323
[43] Lanin A A, Fedotov I V, Fedotov A B, Sidorov-Biryukov D A and Zheltikov A M 2013 Sci. Rep. 3 1842
[44] Liang S, Li D H and Gao X Y 2007 8th International Conference on Electronic Measurement and Instruments, August 16-18, 2007, Xi'an, China, p. 1563
[45] Williams S R and Wozny C 2011 Nat. Commun. 2 242
[46] Li J Y, Luo L F, Xu J Z and Zeng J H 2010 International Conference on Intelligent System Design and Engineering Application, October 13-14, 2010, Changsha, China, p. 174
[47] Acharya B A and John V 2010 Joint International Conference on Power Electronics, Drives and Energy Systems, December 20-23, 2010, New Delhi, India, p. 1
[48] Li S H and Liaw C M 2003 IEE Proceedings-Electric Power Applications, April 08, 2003, IET, p. 21
[49] Huang Y Y, Hamhee J, Yoon Y, Woo W, Lee C, Kenney J S, Chang-Ho L and Kenney J S 2012 IEEE Trans. Microw. Theory Tech. 60 301
[50] Seung-Hoon L and Bang-Sup S 1992 IEEE J. Solid-State Circuits 27 1679
[51] Ruocco G and Fratalocchi A 2014 Sci. Rep. 4 7088
[1] Hardware for multi-superconducting qubit control and readout
Zhan Wang(王战), Hai Yu(于海), Rongli Liu(刘荣利), Xiao Ma(马骁), Xueyi Guo(郭学仪), Zhongcheng Xiang(相忠诚), Pengtao Song(宋鹏涛), Luhong Su(苏鹭红), Yirong Jin(金贻荣), and Dongning Zheng(郑东宁). Chin. Phys. B, 2021, 30(11): 110305.
[2] Border effect-based precise measurement of any frequency signal
Bai Li-Na (白丽娜), Ye Bo (叶波), Xuan Mei-Na (宣美娜), Jin Yu-Zhen (金瑜珍), Zhou Wei (周渭). Chin. Phys. B, 2015, 24(12): 120601.
No Suggested Reading articles found!