Chin. Phys. B
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Chin. Phys. B  2017, Vol. 26 Issue (8): 088501    DOI: 10.1088/1674-1056/26/8/088501
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY Current Issue| Next Issue| Archive| Adv Search |
Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell
Bing Ye(叶兵)1,2,3, Jie Liu(刘杰)1, Tie-Shan Wang(王铁山)3, Tian-Qi Liu(刘天奇)1,2, Jie Luo(罗捷)1,2, Bin Wang(王斌)1,2, Ya-Nan Yin(殷亚楠)1,2, Qing-Gang Ji(姬庆刚)1,2, Pei-Pei Hu(胡培培)1,2, You-Mei Sun(孙友梅)1, Ming-Dong Hou(侯明东)1
1 Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;
2 University of Chinese Academy of Sciences (UCAS), Beijing 100049, China;
3 Lanzhou University, Lanzhou 730000, China

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