Chin. Phys. B
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Chin. Phys. B  2017, Vol. 26 Issue (4): 047801    DOI: 10.1088/1674-1056/26/4/047801
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Structural characterization of Al0.55Ga0.45N epitaxial layer determined by high resolution x-ray diffraction and transmission electron microscopy
Qing-Jun Xu(徐庆君)1,2, Bin Liu(刘斌)1, Shi-Ying Zhang(张士英)1,2, Tao Tao(陶涛)1, Zi-Li Xie(谢自力)1, Xiang-Qian Xiu(修向前)1, Dun-Jun Chen(陈敦军)1, Peng Chen(陈鹏)1, Ping Han(韩平)1, Rong Zhang(张荣)1, You-Dou Zheng(郑有炓)1
1 Key Laboratory of Advanced Photonic and Electronic Materials, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China;
2 College of Optoelectronics Engineering, Zaozhuang University, Zaozhuang 277160, China

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