Chin. Phys. B
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Chin. Phys. B  2016, Vol. 25 Issue (8): 087701    DOI: 10.1088/1674-1056/25/8/087701
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Electron trapping properties at HfO2/SiO2 interface, studied by Kelvin probe force microscopy and theoretical analysis
Man-Hong Zhang(张满红)
School of Electrical and Electronic Engineering, North China Electric Power University, Beijing 102206, China

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