Chin. Phys. B
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Chin. Phys. B  2015, Vol. 24 Issue (10): 108503    DOI: 10.1088/1674-1056/24/10/108503
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A novel diode string triggered gated-PiN junction device for electrostatic discharge protection in 65-nm CMOS technology
Zhang Li-Zhong, Wang Yuan, Lu Guang-Yi, Cao Jian, Zhang Xing
Institute of Microelectronics, Peking University, Beijing 100871, China

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