Chin. Phys. B
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Chin. Phys. B  2015, Vol. 24 Issue (10): 106106    DOI: 10.1088/1674-1056/24/10/106106
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation
Zheng Qi-Wena b c, Cui Jiang-Weia b, Zhou Hanga b c, Yu De-Zhaoa b c, Yu Xue-Fenga b, Lu Wua b, Guo Qia b, Ren Di-Yuana b
a Key Laboratory of Functional Materials and Devices for Special Environments, Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China;
b Xinjiang Key Laboratory of Electronic Information Material and Device, Urumqi 830011, China;
c University of Chinese Academy of Sciences, Beijing 100049, China

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