Chin. Phys. B
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Chin. Phys. B  2015, Vol. 24 Issue (9): 096103    DOI: 10.1088/1674-1056/24/9/096103
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
In-situ wafer bowing measurements of GaN grown on Si (111) substrate by reflectivity mapping in metal organic chemical vapor deposition system
Yang Yi-Bina b, Liu Ming-Ganga b, Chen Wei-Jiea b, Han Xiao-Biaoa b, Chen Jiea b, Lin Xiu-Qia b, Lin Jia-Lia b, Luo Huia b, Liao Qianga b, Zang Wen-Jiea b, Chen Yin-Songa b, Qiu Yun-Linga b, Wu Zhi-Shenga, Liu Yangb, Zhang Bai-Juna b
a State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-Sen University, Guangzhou 510275, China;
b School of Physics and Engineering, Institute of Power Electronics and Control Technology, Sun Yat-Sen University, Guangzhou 510275, China

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