Chin. Phys. B
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Chin. Phys. B  2015, Vol. 24 Issue (8): 088503    DOI: 10.1088/1674-1056/24/8/088503
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY Current Issue| Next Issue| Archive| Adv Search |
Low frequency noise and radiation response in the partially depleted SOI MOSFETs with ion implanted buried oxide
Liu Yuana, Chen Hai-Bob, Liu Yu-Rongc, Wang Xind, En Yun-Feia, Li Binc, Lu Yu-Donga
a Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, CEPREI, Guangzhou 510610, China;
b No. 58th Research Institute of China Electronics Technology Group Corporation, Wuxi 214035, China;
c School of Electronic and Information Engineering, South China University of Technology, Guangzhou 510640, China;
d Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China

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