Structured dark-field imaging for single nano-particles

doi:10.1088/1674-1056/24/8/086804

Abstract

In this work, we extensively describe and demonstrate the structured dark-field imaging (SDFI). SDFI is a newly proposed x-ray microscopy designed for revealing the fine features below Rayleigh resolution, in which different orders of scattered x-ray photons are collected by changing the numerical aperture of the condenser. Here, the samples of single particles are discussed to extend the scope of the SDFI technique reported in a previous work (Chen J, Gao K, Ge X, et al. 2013 Opt. Lett. 38 2068). In addition, the details of the newly invented algorithm are explained, which is able to calculate the intensity of any pixel on the image plane rapidly and reliably.

Keywords: x-ray microscopy Rayleigh resolution fast algorithm

Received: 08 February 2015
Revised: 12 March 2015
Accepted manuscript online:

PACS:	68.37.Yz	(X-ray microscopy)
	87.59.-e	(X-ray imaging)

Fund:

Project supported by the National Basic Research Program of China (Grant No. 2012CB825800), the Science Fund for Creative Research Groups, the National Natural Science Foundation of China (Grant Nos. 11475170, 11205157, 11305173, and 11321503), and the Knowledge Innovation Program of the Chinese Academy of Sciences (Grant No. KJCX2-YW-N42).

Corresponding Authors: Gao Kun
E-mail: gaokun@ustc.edu.cn

Cite this article:

Chen Jian (陈健), Gao Kun (高昆), Wang Zhi-Li (王志立), Yun Wen-Bing (云文兵), Wu Zi-Yu (吴自玉) Structured dark-field imaging for single nano-particles 2015 Chin. Phys. B 24 086804

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