Chin. Phys. B
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Chin. Phys. B  2015, Vol. 24 Issue (2): 028102    DOI: 10.1088/1674-1056/24/2/028102
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Influence of substrate bias voltage on the microstructure of nc-SiOx:H film
Li Hui-Min, Yu Wei, Xu Yan-Mei, Ji Yun, Jiang Zhao-Yi, Wang Xin-Zhan, Li Xiao-Wei, Fu Guang-Sheng
Hebei Key Laboratory of Optic-electronic Information Materials, College of Physics Science and Technology, Hebei University, Baoding 071002, China

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