Chin. Phys. B
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Chin. Phys. B  2014, Vol. 23 Issue (6): 065206    DOI: 10.1088/1674-1056/23/6/065206
PHYSICS OF GASES, PLASMAS, AND ELECTRIC DISCHARGES Current Issue| Next Issue| Archive| Adv Search |
Ray tracing method for the grazing incidence flat-field imaging soft X-ray spectrometer
Dong Quan-Lia, Liu Yun-Quanb, Teng Haoc, Li Ying-Jund, Zhang Jiec e
a School of Physics and Optoelectronic Engineering, Ludong University, Yantai 260405, China;
b Department of Physics, State Key Laboratory for Mesoscopic Physics, Peking University, Beijing 100871, China, Collaborative Innovation Center of Quantum Matter, Beijing 100871, China;
c Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
d State Key Laboratory for GeoMechanics and Deep Underground Engineering, ChinaUniversity of Mining and Technology, Beijing 100083, China;
e Key Laboratory for Laser Plasmas (MoE) and Department of Physics, Shanghai Jiao Tong University, Shanghai 200240, China

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