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Chin. Phys. B, 2014, Vol. 23(3): 037302    DOI: 10.1088/1674-1056/23/3/037302
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

Improved mobility of AlGaN channel heterojunction material using an AlGaN/GaN composite buffer layer

Wen Hui-Juan (温慧娟), Zhang Jin-Cheng (张进成), Lu Xiao-Li (陆小力), Wang Zhi-Zhe (王之哲), Ha Wei (哈微), Ge Sha-Sha (葛莎莎), Cao Rong-Tao (曹荣涛), Hao Yue (郝跃)
State Key Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an 710071, China
Abstract  The quality of an AlGaN channel heterojunction on a sapphire substrate is massively improved by using an AlGaN/GaN composite buffer layer. We demonstrate an Al0.4Ga0.6N/Al0.18Ga0.82N heterojunction with a state-of-the-art mobility of 815 cm2/(V·s) and a sheet resistance of 890 Ω/ under room temperature. The crystalline quality and the electrical properties of the AlGaN heterojunction material are analyzed by atomic force microscopy, high-resolution X-ray diffraction, and van der Pauw Hall and capacitance–voltage (C–V) measurements. The results indicate that the improved electrical properties should derive from the reduced surface roughness and low dislocation density.
Keywords:  AlGaN channel      heterojunction      mobility      electrical properties  
Received:  12 August 2013      Revised:  24 September 2013      Accepted manuscript online: 
PACS:  73.40.Kp (III-V semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions)  
  73.40.-c (Electronic transport in interface structures)  
  73.61.Ey (III-V semiconductors)  
  78.30.Fs (III-V and II-VI semiconductors)  
Fund: Project supported by the National Science and Technology Major Project of the Ministry of Science and Technology of China (Grant Nos. 2011ZX01002-002 and 2013ZX02308-002), the Fundamental Research Funds for the Central Universities of Ministry of Education of China, and the National Natural Science Foundation of China (Grant Nos. 61204006 and 61106063).
Corresponding Authors:  Zhang Jin-Cheng     E-mail:  jchzhang@xidian.edu.cn

Cite this article: 

Wen Hui-Juan (温慧娟), Zhang Jin-Cheng (张进成), Lu Xiao-Li (陆小力), Wang Zhi-Zhe (王之哲), Ha Wei (哈微), Ge Sha-Sha (葛莎莎), Cao Rong-Tao (曹荣涛), Hao Yue (郝跃) Improved mobility of AlGaN channel heterojunction material using an AlGaN/GaN composite buffer layer 2014 Chin. Phys. B 23 037302

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