Low-cost, high performance surface plasmon resonance-compatible films characterized by surface plasmon resonance technique

doi:10.1088/1674-1056/22/7/077302

Abstract A new analytical method based on the surface plasmon resonance (SPR) technique is presented, with which SPR curves for both wavelength and angular modulations can be obtained simultaneously via only a single scan of the incident angle. Using this method, the SPR responses of TiO₂-coated Cu films are characterized in the wavelength range from 600 nm to 900 nm. For the first time, we determine the effective optical constants and the thicknesses of TiO₂-coated Cu films using the SPR curves of wavelength modulation. The sensitivities of prism-based SPR refractive index sensors using TiO₂-coated Cu films are investigated theoretically for both wavelength and angular modulations, the results show that in the case of sensitivity with wavelength modulation, TiO₂-coated Cu films are not as good as the Au film, however, they are more suitable than the Au film for SPR refractive index sensors with angular modulation because a higher sensitivity can be achieved.

Keywords: surface plasmon resonance optical constants thin film

Received: 25 December 2012
Revised: 18 January 2013
Accepted manuscript online:

PACS:	73.20.Mf	(Collective excitations (including excitons, polarons, plasmons and other charge-density excitations))
	78.20.-e	(Optical properties of bulk materials and thin films)

Fund: Project supported by the National Natural Science Foundation of China (Grant No. 61177079) and the Young Scientists Fund of the National Natural Science Foundation of China (Grant No. 61205071).

Corresponding Authors: Ye Hong-An
E-mail: yehonganhlj@gmail.com

Cite this article:

Li Song-Quan (李松权), Ye Hong-An (叶红安), Liu Chun-Yu (柳春郁), Dou Yin-Feng (窦寅丰), Huang Yan (黄妍) Low-cost, high performance surface plasmon resonance-compatible films characterized by surface plasmon resonance technique 2013 Chin. Phys. B 22 077302

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Low-cost, high performance surface plasmon resonance-compatible films characterized by surface plasmon resonance technique

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