Chin. Phys. B
Citation Search Quick Search
Chin. Phys. B  2013, Vol. 22 Issue (5): 057105    DOI: 10.1088/1674-1056/22/5/057105
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Effect of high-temperature buffer thickness on quality of AlN epilayer grown on sapphire substrate by metalorganic chemical vapor deposition
Liu Boa, Zhang Senb, Yin Jia-Yuna, Zhang Xiong-Wena, Dun Shao-Boa, Feng Zhi-Honga, Cai Shu-Juna
a Science and Technology on ASIC Laboratory, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China;
b School of Physical and Mathematical Sciences, Nanyang Technology University, Singapore 637371, Singapore

Copyright © the Chinese Physical Society
Address: Institute of Physics, Chinese Academy of Sciences, P. O. Box 603,Beijing 100190 China(100190)
Tel: 010-82649026   Fax: 010-82649027   E-Mail: cpb@aphy.iphy.ac.cn
Supported by Beijing Magtech Co. Ltd. Tel: 86-010-62662699 E-mail: support@magtech.com.cn