Chin. Phys. B
Citation Search Quick Search
Chin. Phys. B  2013, Vol. 22 Issue (4): 047304    DOI: 10.1088/1674-1056/22/4/047304
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Hot carrier degradation and a new lifetime prediction model in ultra-deep sub-micron pMOSFET
Lei Xiao-Yia, Liu Hong-Xiaa, Zhang Kaia, Zhang Yuea, Zheng Xue-Fenga, Ma Xiao-Huaa b, Hao Yuea
a Key Laboratory of Wide Bandgap Semiconductor Materials and Devices of Ministry of Education, State Key Discipline Laboratory of Wide Bandgap Semiconductor Technologies,School of Microelectronics, Xidian University, Xi'an 710071, China;
b School of Technical Physics, Xidian University, Xi'an 710071, China

Copyright © the Chinese Physical Society
Address: Institute of Physics, Chinese Academy of Sciences, P. O. Box 603,Beijing 100190 China(100190)
Tel: 010-82649026   Fax: 010-82649027   E-Mail: cpb@aphy.iphy.ac.cn
Supported by Beijing Magtech Co. Ltd. Tel: 86-010-62662699 E-mail: support@magtech.com.cn