Chin. Phys. B
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Chin. Phys. B  2012, Vol. 21 Issue (1): 017103    DOI: 10.1088/1674-1056/21/1/017103
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Determination of the series resistance under the Schottky contacts of AlGaN/AlN/GaN Schottky barrier diodes
Chen Honga, Wang Zhan-Guob, Cao Zhi-Fangc, Lin Zhao-Junc, Lü Yuan-Jiec, Luan Chong-Biaoc, Yu Ying-Xiac
a Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; b Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; c School of Physics, Shandong University, Jinan 250100, China

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