Chin. Phys. B
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Chin. Phys. B  2011, Vol. 20 Issue (9): 096102    DOI: 10.1088/1674-1056/20/9/096102
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boldmath In situ high temperature X-ray diffraction studies of ZnO thin film
Chen Xiang-Cun, Zhou Jie-Ping, Wang Hai-Yang, Xu Peng-Shou, Pan Guo-Qiang
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China

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