|
|
|
In situ high temperature X-ray diffraction studies of ZnO thin film |
| Chen Xiang-Cun(陈香存), Zhou Jie-Ping(周解平), Wang Hai-Yang(王海洋), Xu Peng-Shou(徐彭寿), and Pan Guo-Qiang(潘国强)† |
| National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China |
|
|
|
|
Abstract An epitaxial ZnO thin film was entirely fabricated by pulsed laser deposition. Both the orientation and the size of the crystallites were studied. The X-ray diffraction (XRD) patterns of the film show strong c-axis oriented crystal structure with preferred (002) orientation. The Phi-scan XRD pattern confirms that the epitaxial ZnO exhibits a single-domain wurtzite structure with hexagonal symmetry. In situ high-temperature XRD studies of ZnO thin film show that the crystallite size increases with increasing temperature, and (002) peaks shift systematically toward lower 2θ values due to the change of lattice parameters. The lattice parameters show linear increase in their values with increasing temperature.
|
Received: 24 February 2011
Revised: 27 March 2011
Accepted manuscript online:
|
|
PACS:
|
61.72.uj
|
(III-V and II-VI semiconductors)
|
| |
61.05.cp
|
(X-ray diffraction)
|
| |
68.35.-p
|
(Solid surfaces and solid-solid interfaces: structure and energetics)
|
|
Cite this article:
Chen Xiang-Cun(陈香存), Zhou Jie-Ping(周解平), Wang Hai-Yang(王海洋), Xu Peng-Shou(徐彭寿), and Pan Guo-Qiang(潘国强) In situ high temperature X-ray diffraction studies of ZnO thin film 2011 Chin. Phys. B 20 096102
|
| [1] |
Matsubara K, Fons P, Iwata K, Yamada A, Sakurai K, Tampo H and Niki S 2003 Thin Solid Films 369 431
|
| [2] |
Paul G K, Bandyapadhyay S and Sen S K 2002 Phys. Stat. Sol. A 19 509
|
| [3] |
Look D C, Reynolds D C, Litton C W, Jones R L, Eason D B and Cantwell G 2002 Appl. Phys. Lett. 81 1830
|
| [4] |
Zhang X J, Ma H L, Li Y X, Wang Q P, Ma J, Zong F J and Xiao H D 2006 Chin. Phys. 15 2385
|
| [5] |
Wang X, Careg W P and Yee S 1995 Sensors Actuators B 28 63
|
| [6] |
Srivastava J K, Agrawal L and Bhattacharyya B 1989 Electrochem. Soc. 11 3414
|
| [7] |
Ohto Y, Haga T and Abe Y 1997 Jpn. J. Appl. Phys. 36 L1040
|
| [8] |
Preetam S, Ashvani K, Deepak and Davinder K 2007 J. Crystal Growth 306 303
|
| [9] |
Preetam S, Ashvani K, Ajay K, Davinder K, Ashish P and Goyal R N 2008 Bull. Mater. Sci. 31 573
|
| [10] |
Sun C W, Liu Z W and Zhang Q Y 2006 Acta Phys. Sin. 55 430 (in Chinese)
|
| [11] |
Wang Z J, Wang Z J, Li S C, Wang Z H, Lü Y M and Yuan J S 2004 Chin. Phys. 13 750
|
| [12] |
Wen X M, Ohno N and Zhang Z M 2001 Chin. Phys. 10 874
|
| [13] |
Zeng J N, Low J K, Ren Z M, Liew T and Lu Y F 2002 Appl. Surf. Sci 197 362
|
| [14] |
Ohshima T, Thareja R K, Ikegami T and Ebihara K 2003 Surface and Coatings Technology 169—170 517
|
| [15] |
Lamber R, Wetjen S and Jaeger N I 1995 Phys. Rev. B 51 10968
|
| [16] |
Banerjee R, Sperling E A, Thompson G B, Fraser H L, Bose S and Ayyub P 2003 Appl. Phys. Lett. 82 4250
|
| [17] |
Cullity B D 1970 Elements of X-ray Diffraction (Reading: Addison-Wesley) p. 102
|
| [18] |
Nanda K K, Kruis F E and Fissan H 2002 Phys. Rev. Lett. 89 256103
|
| [19] |
Fang Z B, Gong H X, Liu X Q, Xu D Y, Huang C M and Wang Y Y 2003 Acta Phys. Sin. 52 1748 (in Chinese)
|
| No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|
