Structural modification of C60 films induced by 300-keV Xe-ion irradiation

doi:10.1088/1674-1056/20/7/076105

Abstract The structural modification of C₆₀ films induced by 300-keV Xe-ion irradiation was investigated. The irradiated C₆₀ films were analysed using Fourier transform infrared spectroscopy, the Raman scattering technique, ultraviolet/visible spectrophotometry and atomic force microscopy. The analysis results indicate that the Xe-ion irradiation induces polymerization and damage of the C₆₀ molecule and significantly modifies the surface morphology and the optical property of the C₆₀ films. The damage cross-section for the C₆₀ molecule was also evaluated.

Keywords: C₆₀ films ions irradiation damage polymerization

Received: 19 February 2011
Revised: 02 March 2011
Accepted manuscript online:

PACS:	61.80.-x	(Physical radiation effects, radiation damage)
	78.30.-j	(Infrared and Raman spectra)

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Yao Cun-Feng (姚存峰), Jin Yun-Fan(金运范), Wang Zhi-Guang(王志光), Pang Li-Long(庞立龙), Shen Tie-Long(申铁龙), and Zhu Ya-Bin(朱亚滨) Structural modification of C₆₀ films induced by 300-keV Xe-ion irradiation 2011 Chin. Phys. B 20 076105

[1]	Krätschmer W, Lamb Lowell D, Fostiropoulos K and Huffman D R 1990 Nature 347 354
[2]	Hebard A F, Rosseinsky M J, Haddon R C, Murphy D W, Glarum S H, Palstra T M, Ramirez A P and Kortan A R 1991 Nature 350 600
[3]	Ganin A Y, Takabayashi Y, Khimyak Y Z, Margadonna S, Tamai A, Rosseinsky M J and Prassides K 2008 Nat. Mater. 7 367
[4]	Zhang X H, Domercq B and Kippelen B 2007 Appl. Phys. Lett. 91 092114
[5]	Hongkun P, Jiwoong P, Andrew K, Lim L, Anderson E H, Alivisatos A P and McEuen P L 2003 Nature 407 54
[6]	Maeda-Mamiya R, Noiri E, Isobe H, Nakanishi W, Okamoto K, Doi K, Sugaya T, Izumi T, Homma T and Nakamura E 2010 Proc. Natl Acad. Sci. U.S.A. 107 5339
[7]	Sijbesma R, Srdanov G, Wudl F, Castoro J A, Wilkins C, Friedman S H, DeCamp D L and Kenyon G L 1993 J. Am. Chem. Soc. 115 6510
[8]	Tutt L W and Alan K 1992 Nature 356 225
[9]	Seraphin S, Zhou D and Jiao J 1993 J. Mater. Res. 8 1895
[10]	Onoe J, Nakayama T, Aono M and Hara T 2004 J. Phys. Chem. Solids 65 343
[11]	Palmetshofer L and Kastner J 1995 Nucl. Instr. and Meth. B 96 343
[12]	Zawislak F C, Baptista D L, Behar M, Fink D, Grande P L and Jornada J A H 1999 Nucl. Instr. and Meth. B 149 336
[13]	Kumar A, Avasthi D K, Pivin J C, Tripathi A and Singh F 2006 Phys. Rev. B 74 153409
[14]	Bianconi M, Argiolas N, Bazzan M, Bentini G G, Chiarini M, Cerutti A, Mazzoldi P, Pennestr`hi G and Sada C 2006 Nucl. Instr. and Meth. B 249 122
[15]	Backman M, Djurabekova F, Pakarinen O H, Nordlund K and Toulemode M 2010 MRS Proceedings 1264 1264-BB02-07
[16]	Ziegler J F, Biersack J P and Littmark U 1985 The Stopping and Range of Ions in Solids (UK: Pergamon Press)
[17]	Zhou W Y, Xie S S, Qian S F, Wang G and Qian L X 1996 J. Phys.: Condens. Matter 8 5793
[18]	Gaffar M A and Abu El-Fadl A 1999 Cryst. Res. Technol. 34 915
[19]	Abdel-Fattah A A, Abdel-Hamid H M and Radwan R M 2002 Nucl. Instr. and Meth. B 196 279
[20]	Santhakumar K, Nair K G M , Kesavamoorthy R and Ravichandran V 1999 Nucl. Instr. and Meth. B 212 381
[21]	Zang H, Wang Z G, Pang L L, Wei K F, Yao C F, Shen T L, Sun J R, Ma Y Z, Gou J, Sheng Y B and Zhu Y B 2010 Acta Phys. Sin. 59 4831 (in Chinese)
[22]	Rao A M, Zhou P, Wang K A, Hager G T, Holden J M, Wang Y, Lee W T, Bi X X, Eklund P C , Cornett D S, Duncan M A and Amster I J 1993 Science 259 955
[23]	Eklund P C, Zhou P, Wang K A, Dresselhaus G and Dresselhaus M S 1992 J. Phys. Chem. Solids. 53 1391
[24]	Kroto H W, Heath J R, O'Brian S C, Curl R F and Smalley R E 1985 Nature 318 162
[25]	Dresselhaus M S , Dresselhaus G and Klund P C 1996 J. Raman Spect. 27 351
[26]	Bennington S M, Kitamura N, Cain M G, Lewis M H, Wood R A, Fukumiand A K and Funakoshi K 2000 J. Phys: Condens. Matter 12 L451
[27]	Waagberg T, Jacobsson P and Sundqvist B 1999 Phys. Rev. B 60 4535
[28]	Porezag D, Pederson M R, Frauenheim T and Köhler T 1995 Phys. Rev. B 52 14963
[29]	Yogo A, Majima T and Itoh A 2002 Nucl. Instr. and Meth. B 193 299
[30]	Rao A M, Eklund P C, Hodeau J L, Marques L and Nunez-Regueiro M 1997 Phys. Rev. B 55 4766
[31]	Hare J P, Dennis T J, Kroto H W, Taylor R, Allaf A W, Balm S and David R M 1991 J. Chem. Soc. Chem. Commun. 412
[32]	Prawer S, Nugent K W, Biggs S, McCulloch D G, Leong W H, Hoffman A and Kalish R 1995 Phys. Rev. B 52 841

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Structural modification of C60 films induced by 300-keV Xe-ion irradiation

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Structural modification of C₆₀ films induced by 300-keV Xe-ion irradiation