Chin. Phys. B
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Chin. Phys. B  2011, Vol. 20 Issue (4): 040701    DOI: 10.1088/1674-1056/20/4/040701
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Measurements of electron–phonon coupling factor and interfacial thermal resistance of metallic nano-films using a transient thermoreflectance technique
Wang Weia, Wang Hai-Dongb, Ma Wei-Gangb, Guo Zeng-Yuanb, Zhang Xingb
a Institute of Microelectronics, Peking University, Beijing 100871, China; b Key Laboratory for Thermal Science and Power Engineering of Ministry of Education, Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China

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