Influence of line defects on focusing in a two-dimensional photonic-crystal flat lens

doi:10.1088/1674-1056/19/6/067201

Abstract We investigate in detail the influence of line defects on focusing of electromagnetic waves in a two-dimensional photonic-crystal flat lens. Through simulations, we find that a focusing can always be observed when a line defect in the lens is introduced along the light transmission direction and the width of the line defect is less than $\lambda$/2. However, there appear two focusings when the width of the line defect is more than $\lambda$/2. When the line defect is introduced along the direction perpendicular to the transmission, there is always one focusing.

Keywords: flat lens line defect photonic crysta

Received: 04 May 2009
Accepted manuscript online:

PACS:	42.79.Bh	(Lenses, prisms and mirrors)
	42.70.Qs	(Photonic bandgap materials)
	02.70.Bf	(Finite-difference methods)

Fund: Project supported by the National Natural Science Foundation of China (Grant No.~10704006).

Cite this article:

Feng Zhi-Fang(冯志芳) Influence of line defects on focusing in a two-dimensional photonic-crystal flat lens 2010 Chin. Phys. B 19 067201

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Influence of line defects on focusing in a two-dimensional photonic-crystal flat lens

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