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Chin. Phys. B, 2010, Vol. 19(4): 040601    DOI: 10.1088/1674-1056/19/4/040601
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Measurement and control for a repetitive nanosecond-pulse breakdown experiment in polymer films

Shao Tao(邵涛), Zhang Cheng(章程), Long Kai-Hua(龙凯华), Wang Jue(王珏), Zhang Dong-Dong(张东东), and Yan Ping(严萍)
Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing 100190, China
Abstract  In order to perform data acquisition and avoid unwanted over-current damage to the power supply, a convenient and real-time method of experimentally investigating repetitive nanosecond-pulse breakdown in polymer dielectric samples is presented. The measurement-acquisition and control system not only records breakdown voltage and current, and time-to-breakdown duration, but also provides a real-time power-off protection for the power supply. Furthermore, the number of applied pulses can be calculated by the product of the time-to-breakdown duration and repetition rate. When the measured time-to-breakdown duration error is taken into account, the repetition rate of applied nanosecond-pulses should be below 40~kHz. In addition, some experimental data on repetitive nanosecond-pulse breakdown of polymer films are presented and discussed.
Keywords:  nanosecond-pulse breakdown      repetitive nanosecond pulses      polymer film      time-to-breakdown duration  
Received:  04 September 2009      Revised:  28 September 2009      Accepted manuscript online: 
PACS:  77.55.+f  
  77.84.Jd (Polymers; organic compounds)  
  77.22.Jp (Dielectric breakdown and space-charge effects)  
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos.~50707032 and 50437020), the Knowledge Innovation Program of the Chinese Academy of Sciences (Grant No.~KGCX2-YW-339), and the State Key Laboratory of Control and Simulation

Cite this article: 

Shao Tao(邵涛), Zhang Cheng(章程), Long Kai-Hua(龙凯华), Wang Jue(王珏), Zhang Dong-Dong(张东东), and Yan Ping(严萍) Measurement and control for a repetitive nanosecond-pulse breakdown experiment in polymer films 2010 Chin. Phys. B 19 040601

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