Chin. Phys. B
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Chin. Phys. B  2009, Vol. 18 Issue (9): 03966    DOI: 10.1088/1674-1056/18/9/057
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Simulation of grain boundary effect on characteristics of ZnO thin film transistor by considering the location and orientation of grain boundary
He Yi-Ganga, Lu Ai-Xiab, Wan Qingb, Zhou Yu-Mingc
a College of Electrical and Information Engineering, Hunan University, Changsha 410082, China; b College of Physics and Microelectronic, Hunan University, Changsha 410082, China; c College of Physics and Microelectronic, Hunan University, Changsha 410082, China;College of Electrical and Information Engineering, Hunan University, Changsha 410082, China

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