Chin. Phys. B
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Chin. Phys. B  2008, Vol. 17 Issue (9): 3459-3463    DOI: 10.1088/1674-1056/17/9/053
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Raman analysis of defects in n-type 4H-SiC
Wang-Pinga, Yang Yin-Tangb, Han Rub
a Qimonda Technologies Xi'an, Xi'an 710075, China; b School of Microelectronics, Xidian University, Key Laboratory of Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, Xi'an 710071, China

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