Chin. Phys. B
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Chin. Phys.  2007, Vol. 16 Issue (8): 2310-2314    DOI: 10.1088/1009-1963/16/8/025
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Electronic structure and defect states of transition films from amorphous to microcrystalline silicon studied by surface photovoltage spectroscopy
Yu Wei, Wang Chun-Sheng, Lu Wan-Bing, He Jie, Han Xiao-Xia, Fu Guang-Sheng
College of Physical Science and Technology, Hebei University, Baoding 071002, China

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