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Chinese Physics, 2006, Vol. 15(8): 1731-1737    DOI: 10.1088/1009-1963/15/8/017
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In-line phase contrast for weakly absorbing materials with a microfocus x-ray source

Zhang Di(章迪), Li Zheng(李政), Huang Zhi-Feng(黄志峰), Yu Ai-Min(禹爱民), and Sha Wei(沙薇)
Department of Engineering Physics, Tsinghua University, Beijing 100084, China
Abstract  For weakly absorbing materials, image contrast can be enhanced by phase contrast in formation. The effectiveness of the in-line phase contrast technique relies on its ability to record intensity data which contain information on the x-ray's phase shift. Four kinds of approaches to the relationship between intensity distribution and phase shift are reviewed and discussed. A micro-focal x-ray source with high geometrical magnification is used to acquire phase contrast images. A great improvement on image quality is shown and geometrical parameters are modified for comparison between different imaging positions.
Keywords:  in-line phase contrast      intensity distribution      microfocus      Fresnel diffraction  
Received:  09 December 2005      Revised:  22 April 2006      Accepted manuscript online: 
PACS:  07.85.Fv (X- and γ-ray sources, mirrors, gratings, and detectors)  
  42.30.Kq (Fourier optics)  
  42.30.Wb (Image reconstruction; tomography)  
Fund: Project supported by the National Natural Science Foundation of China (Grant No 10475044).

Cite this article: 

Zhang Di(章迪), Li Zheng(李政), Huang Zhi-Feng(黄志峰), Yu Ai-Min(禹爱民), and Sha Wei(沙薇) In-line phase contrast for weakly absorbing materials with a microfocus x-ray source 2006 Chinese Physics 15 1731

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