Abstract The low-energy electron point source (LEEPS) microscope, which creates enlarged projection images with low-energy field emission electron beams, can be used to observe the projection image of nano-scale samples and to characterize the coherence of the field emission beam. In this paper we report the design and test operation performance of a home-made LEEPS microscope. Multi-walled carbon nanotubes (MWCNTs) synthesized by the CVD method were observed by LEEPS microscope using a conventional tungsten tip, and projection images with the magnification of up to 104 was obtained. The resolution of the acquired images is $\sim$10 nm. A higher resolution and a larger magnification can be expected when the AC magnetic field inside the equipment is shielded and the vibration of the instrument reduced.
Received: 18 December 2005
Revised: 24 February 2006
Accepted manuscript online:
(Field emission, ionization, evaporation, and desorption)
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos.60231010, 60471008, and 60571003) and the National Center for Nanoscience and Technology of China.
Cite this article:
Yu Jie (于洁), Bai Xin (柏鑫), Zhang Zhao-Xiang (张兆祥), Zhang Geng-Min (张耿民), Guo Deng-Zhu (郭等柱), Xue Zeng-Quan (薛增泉) Observation of MWCNTs with low-energy electron point source microscope 2006 Chinese Physics 15 1558
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