Selective reflection combined with Fabry--Perot effects from two-level atoms confined between two dielectric walls
Li Yuan-Yuan (李院院)a, Zhou Yu (周瑜)b, Zhang Gui-Zhong (张贵忠)b
a Department of Physics and Information Technology, Ningxia Guyuan Teachers College, Guyuan 756000, China; b College of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin 300072, China
Abstract The coefficient of selective reflection at oblique incidence from two-level atoms confined between two dielectric walls is calculated in this paper. It is found to be related to the transient behaviour of atoms after colliding with the wall and the distribution of the field inside the vapour corresponds to $L / \lambda$, with L the thickness of the film and $\lambda$ the incident wavelength. We find that the sub-Doppler structure is manifest both for normal incidence and small angle oblique incidence. It is feasible to detect the real part of selective reflection in several cases that have not been achieved before.
Received: 27 April 2005
Revised: 24 November 2005
Accepted manuscript online:
PACS:
79.20.Rf
(Atomic, molecular, and ion beam impact and interactions with surfaces)
Fund: Project supported by Science Foundation of Ningxia Higher Education of China (Grant No 2005153).
Cite this article:
Li Yuan-Yuan (李院院), Zhou Yu (周瑜), Zhang Gui-Zhong (张贵忠) Selective reflection combined with Fabry--Perot effects from two-level atoms confined between two dielectric walls 2006 Chinese Physics 15 985
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