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Chinese Physics, 2006, Vol. 15(2): 432-436    DOI: 10.1088/1009-1963/15/2/033
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Prev   Next  

X-ray diffraction study of effect of deposition conditions on $\alpha-\beta$ phase transition and stress evolution in sputter-deposited W coatings

Wang Cong (王聪)ab, Pascal Braulta, Alain Pineauc, Pascale Plantina, Anne-Lise Thomanna
a Groupie de Recherches sur l'Energé tique des Milieux Ionisés UMR 6606 -CNRS, Ecole Polytechnique de l'Universitéd'Orléans, BP6744 Université d'Orléans, F-45067 Orléans, Cedex 2, France; b School of Science, Beijing University of Astronautics and Aeronautics, Beijing 100083, Chinac Centre de Recherches sur la Matière Divisée – UMR 6619 CNRS – Université d'Orléans, 1B rue de la Férollerie, 45071 Orléans, Cedex 2, France
Abstract  Pure W and W--Cu--W trilayer coatings were deposited on an Fe substrate by d.c. magnetron sputtering. The $\alpha -\beta$ phase evolution, intragranular stress evolution in sputter-deposited W layer were investigated by x-ray diffraction. They are directly related to the film microstructure, density and adhesion. Therefore, control of the film stress and phase component transition is essential for its applications. The phase component transition from $\beta$-W to $\alpha $-W and intragranular stress evolution from tensile to compressive strongly depend on the deposition parameters and can be induced by lowering Ar pressure and rising target power. The compressively stressed films with $\alpha $-W phase have a dense microstructure and high adhesion to Fe substrate.
Keywords:  W coatings      x-ray diffraction      $\alpha$--$\beta$ phase component transition      thin film stress  
Received:  26 May 2005      Revised:  07 November 2005      Accepted manuscript online: 
PACS:  61.05.cp (X-ray diffraction)  
  68.60.Bs (Mechanical and acoustical properties)  
  81.15.Cd (Deposition by sputtering)  
  64.70.K-  
  68.35.Gy (Mechanical properties; surface strains)  
  68.35.Np (Adhesion)  

Cite this article: 

Wang Cong (王聪), Pascal Brault, Alain Pineau, Pascale Plantin, Anne-Lise Thomann X-ray diffraction study of effect of deposition conditions on $\alpha-\beta$ phase transition and stress evolution in sputter-deposited W coatings 2006 Chinese Physics 15 432

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