Abstract Based on the multi-slit method, a new method is introduced to measure the non linear force caused emittance growth in a RF photoinjector. It is possible to reconstruct the phase space of a beam under some conditions by the multi-slit method. Based on the reconstructed phase space, besides the emittance, the emittance growth from the distortion of the phase space can also be measured. The emittance growth results from the effects of nonlinear force acting on electron, which is very important for the high quality beam in a RF photoinjector.
Received: 15 July 2005
Revised: 02 August 2005
Accepted manuscript online:
Fund: Project supported by the
National Natural Science Foundation of China (Grant No 10347009).
Cite this article:
Li Zheng-Hong (李正红), Yang Zhen-Ping (杨振萍) A method to measure the nonlinear force caused emittance growth in a RF photoinjector 2006 Chinese Physics 15 315
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