Chin. Phys. B
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Chin. Phys.  2005, Vol. 14 Issue (8): 1536-1543    DOI: 10.1088/1009-1963/14/8/011
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Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems
Lin Xiao, He Xiao-Bo, Lu Jun-Ling, Gao Li, Huan Qing, Shi Dong-Xia, Gao Hong-Jun
Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China

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