Chin. Phys. B
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Chin. Phys.  2004, Vol. 13 Issue (7): 1110-1113    DOI: 10.1088/1009-1963/13/7/025
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Analysis of the effect of sidewall on the performance of 6H-SiC Schottky barrier source/drain NMOSFETs
Tang Xiao-Yan, Zhang Yi-Men, Zhang Yu-Ming, Gao Jin-Xia
Microelectronics Institute, Xidian University, Xi'an 710071, China

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