X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V2O5 THIN FILM

doi:10.1088/1004-423X/8/1/010

Abstract

Abstract Nanocrystalline V₂O₅ thin films were reactively radio-frequency magnetron-sputtered under optimal deposition parameters. Their electrochemical and electrochromic characteristics were investigated by cyclic voltammetry and in-situ monochromatic transmittance measurements. Upon lithium intercalation, V₂O₅ thin films showed a double electrochromic behavior depending on the wavelength and the intercalation extent. X-ray photoelectron spectroscopy results showed that part of the V⁵⁺ in V₂O₅ was reduced to V⁴⁺ during the Li⁺ intercalation process.

Received: 06 May 1998
Accepted manuscript online:

PACS:	79.60.Bm	(Clean metal, semiconductor, and insulator surfaces)
	78.20.Jq	(Electro-optical effects)
	78.66.Db	(Elemental semiconductors and insulators)

Fund: Project supported by the National Climbing Program of China (Grant No.07-01) and the National Natural Science Foundation of China (Grant No.59782006).

Cite this article:

Wang Zhong-chun (王忠春), Li Zhi-yong (李智勇), Chen Xiao-feng (陈晓峰), Hu Xing-fang (胡行方) X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V₂O₅ THIN FILM 1999 Acta Physica Sinica (Overseas Edition) 8 57

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X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V2O5 THIN FILM

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X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V₂O₅ THIN FILM